首页> 外文期刊>Computer-aided engineering journal >In-circuit functional or emulation#x2014;choosing the right test solution
【24h】

In-circuit functional or emulation#x2014;choosing the right test solution

机译:In-circuit functional or emulation#x2014;choosing the right test solution

获取原文
           

摘要

This paper provides an overview of the current developments in general-purpose automatic test equipment (GPATE) and examines some of the pitfalls in its use. It reviews the range of types of GPATE currently available, explores the latest developments in GPATE technology and looks ahead to some of the advances in digital and analogue techniques, as related to the needs of GPATE systems.

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号