The effect of Bi doping on the quench of amorphous Si directly from the melt during 30hyphen;ps, 0.53hyphen;mgr;m laser irradiation has been studied. The amorphous thickness (45 nm) in Bi implanted samples was observed to increase 50percnt; over the corresponding undoped samples (25 nm). No change in the Bi profile was detected upon amorphization.
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