A comparative reliability assessment of 750nm, 1060nm and 1300nm high power surface light emitting diodes

摘要

AbstractA comparative study of the reliability of high power double heterojunction surface light emitting diodes (SLEDs) operating at 750nm, 1060nm and 1300nm is reported. Data analysis from 9500 hours of fully automated life testing concludes that extremely reliable devices can be produced. Degradation and failure characteristics specific to each operating wavelength are described and related to structural and performance data on each device batch. Median life and activation energies are calculated.