Optical properties of metal films in insulator/metal/insulator systems

摘要

Using as an example SiO2/Cu/SiO2 and Al2O3/Cu/Al2O3 coatings in the wavelength range X =0.35-2.5 mu m, the optical properties of the metal layers in three-layer insulator/metal/insulator systems have been studied. The indicated coatings are obtained by the method of layer-by-layer electron-beam sputtering on silicate glass. The dispersion dependences of the refractive index n and absorption index k of the intermediate copper layer in SiO2)/Cu/SiO2) and Al2O3/Cu/Al2O3 coatings is determined for the first time, using a computational matrix method to calculate the optical constants (n and k) of the separate layers that make up the layered system. It is shown that the properties of the metal films in the coatings under consideration are mainly determined by microstructural effects. (c) 2007 Optical Society of America.