X-ray scattering from films of semiconducting polymers

摘要

A review of recent studies of X-ray scattering from films of semiconducting polymers is presented with an emphasis on materials used for thin film transistors. Common types of scattering experiments are described with a focus on synchrotron X-ray sources. The basic molecular packing structure and microstructural features of polycrystalline thin films of polythiophenes and polyfluorenes are described. The influence of processing conditions, such as thermal annealing, on the microstructure of these materials is outlined and example studies on polythiophenes are presented in detail. The microstructures of blends of these polymers and their co-polymers are also discussed.