Polycrystalline Yhyphen;Bahyphen;Cuhyphen;O thin films with a thickness of about 1 mgr;m have been deposited on alumina substrates. The deposition was made by first sequentially evaporating Y/Ba/Cu layers followed by a heat treatment in an environment containing oxygen. The treated films were polycrystalline, and the electrical results showed an onset temperature of about 100 K and a zerohyphen;resistance temperature of 78 K for the films treated at 850thinsp;deg;C for 2 h in oxygen.
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