New optical technique

摘要

Researchers in Germany have used a new light scattering technique to accurately determine the diameter of semiconductor nanoparticles in solution. The method is called non-invasive back scattering, and can be used to measure particles with diameters between 1 nm to 6,000 nm, and has advantages over traditional methods such as XRD and TEM. Using a NIBS-based high performance particle sizer from Malvern Instruments Ltd, researchers determined the diameter of cadmium selenide nanocrystals and cluster molecules. The technique can accurately determine the diameter of particles in high concentration samples such as suspensions and emulsions without the need for dilution. For example it can be used to measure concentrated slurries of silicas and pigments.