首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >Effect of a Local Ground and Probe Radiation on the Microwave Characterization of Integrated Inductors
【24h】

Effect of a Local Ground and Probe Radiation on the Microwave Characterization of Integrated Inductors

机译:局部接地和探头辐射对集成电感微波特性的影响

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Microwave characterization of an integrated inductor is often carried out with respect to a local ground reference. The measurement outcome, however, does not necessarily reproduce the behavior of the device in an actual circuit where a ground reference does not exist. Furthermore, inductor measurements can be affected by the unequal currents on the inner and outer conductors of the coaxial lines internal to the RF probes. Such currents tend to radiate the microwave energy into the surroundings and manifest themselves as unexpected ripple and resonance features in measurement results. In this study, a measurement model is developed including both effects and is used to analyze experimental data obtained from integrated spiral inductors. A novel deembedding technique is then proposed and applied to eliminate the local ground and unequal coaxial current effects.
机译:集成电感器的微波特性分析通常相对于本地接地基准进行。然而,测量结果不一定再现器件在没有接地基准的实际电路中的行为。此外,电感器的测量可能会受到射频探头内部同轴线的内外导体上的不相等电流的影响。这种电流倾向于将微波能量辐射到周围环境中,并在测量结果中表现为意想不到的纹波和谐振特征。在这项研究中,建立了一个包含两种效应的测量模型,用于分析从集成螺旋电感器获得的实验数据。然后提出并应用了一种新的去嵌技术来消除局部接地和不等同轴电流效应。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号