Development of microwave test bench

摘要

In accordance to the trend of the IT (Information Technology) revolution, nowadays EMC requirements may become more rigorous to cover even up to 18 to 400Hz beyond 1GHz. Coping with such situation, it is indispensable to realize free-space environment and to enhance the function of existing EMC sites (open sites, semi-anechoic chambers), however, it should also be desired to develop a simple but a useful "microwave test bench" by which precise test results are obtained directly on site for designing, manufacturing, adjusting and inspecting various equipment of IT, ISM etc. This paper is a part of development report on the anti-reflection multi-U-fence type microwave test bench (MUTB) as a Universal EMC test site ("U-site" in short).