Raman spectroscopy of low-dimensional structures

摘要

The authors demonstrate two applications of Raman scattering for the characterization of low-dimensional structures: they measure the plasmon properties of a modulation-doped multiple quantum well with multiple subband occupation by Raman scattering and hence determine the electronic subband structure and the subband occupation. Secondly, they report work on the phonon properties of silicon-germanium strained layer superlattices. Using a fully three-dimensional model they calculate the 3D phonon dispersion of confined and extended superlattice phonons and measure the phonon spectra using Raman spectroscopy.