Proposal of susceptibility-measurement method using electric and magnetic fields generated in a TEM cell with short circuit

摘要

A TEM cell for immunity test is usually used in a state of matched circuit loud, where electromagnetic fields play as same as a plane wave. When n TEM cell is terminated with a short circuit, there is a standing wave in it. This fact means that the electric or the magnetic fields are dominantely generated at some specific positions. On the consideration, a susceptibility test method for small electronics parts is proposed to investigate the coupling mechanism caused separately by the fields. Characteristics of a trial test set is studied experimentally, and as examples, the susceptibility characteristics for a small microstrip line and a coil are studied.