In this study, the author presents the non-destructive measurement method that the imaginary part of the complex permittivity of thin dielectric sample which conforms the slit of the cavity resonator is estimated. In the present study, the author calculates the quality factor using finite difference time domain (FDTD) method, on condition that a thin sample is inserted into the rectangular cavity resonator. The excellent agreement is obtained between calculation and measurement, where the variation of the absolute refraction coefficient between them is about 9 percent. The author provided here the measurement chat by the relation between the quality factor calculated by FDTD method and the imaginary part of the permittivity, and then the measurement chart could he used for practical measurement.
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