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Electric Field Effect on Metallic Particle Contamination in a Common Enclosure Gas Insulated Busduct

机译:电场对普通外壳气体绝缘母线槽中金属颗粒污染的影响

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摘要

Sulphur Hexaflouride (SF{sub}6) is generally found to be very sensitive to field perturbations such as those caused by conductor surface imperfections and by conducting particle contaminants. A study of CIGRE group suggests that 20 of failures in Gas Insulated Substations (GIS) is due to the existence of various metallic contaminations in the form of loose particles. The presence of contamination can therefore be a problem with gas-insulated substations operating at high fields. If the effects of these particles could be eliminated, then this would improve the reliability of compressed gas insulated substation. It would also offer the possibility of operating at higher fields to affect a potential reduction in the GIS size with subsequent savings in the cost of manufacture and installation. The purpose of this paper is to develop techniques, which will formulate the basic equations that will govern the movement of metallic particles like aluminum and copper in a bus duct. The simulation considers the electric field effect on particle movement and the results have been presented and analyzed.
机译:通常发现六氟化硫(SF{sub}6)对场扰动非常敏感,例如由导体表面缺陷和传导颗粒污染物引起的场扰动。CIGRE小组的一项研究表明,气体绝缘变电站(GIS)中20%的故障是由于松散颗粒形式的各种金属污染物的存在。因此,对于在高场运行的气体绝缘变电站来说,污染的存在可能是一个问题。如果能够消除这些颗粒的影响,那么这将提高压缩气体绝缘变电站的可靠性。它还将提供在更高油田作业的可能性,以影响GIS尺寸的潜在减小,从而节省制造和安装成本。本文的目的是开发技术,这些技术将制定基本方程,这些方程将控制铝和铜等金属颗粒在母线槽中的运动。仿真考虑了电场对粒子运动的影响,并对结果进行了介绍和分析。

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