SPIRIT: a high robust combinational test generation algorithm

摘要

In this paper, we present an efficient and robust test generation algorithm for combinational circuits based on the Boolean satisfiability method called SPIRIT We elaborate some well-known techniques as well as present some new techniques that improve performance and robustness of test generation algorithms. As a result, SPIRIT achieves 100 fault efficiency for full scan version of the ITC'99 benchmark circuits in a reasonable amount of time.