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Two‐dimensional effects in two‐terminaln+‐p‐n+devices fabricated by planar technology

机译:平面技术制造的二连字符、终端n+连字符p连字符n+设备中的二维效果

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摘要

I‐Vcharacteristics of two‐terminaln+‐p‐n+devices fabricated by planar technology are studied theoretically and experimentally. A quasi‐two‐dimensional (2D) model is used to interpret the experimental results. The results suggest that the 2D effects are a very likely candidate to explain the difference in our results and those obtained with the conventional 1D BARRIT diodes.
机译:从理论和实验上研究了采用平面技术制造的二&连字符;终端n+&连字符;p&连字符;n+器件的I‐V特性.使用准连字符二维(2D)模型来解释实验结果。结果表明,二维效应很有可能解释我们的结果与传统一维BARRIT二极管的结果的差异。

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