The heteroepitaxial growth of ZnSe on GaAsepilayersgrown by molecular beam epitaxy is found to occur via a twohyphen;dimensional growth mechanism. Alternatively, nucleation on a GaAs substrate exhibits threehyphen;dimensional growth characteristics. The differentiation of the type of nucleation is evidenced by reflection highhyphen;energy electron diffraction intensity oscillations, as well as the dynamic behavior of the diffraction patterns. Photoluminescence measurements of pseudomorphic ZnSe epilayers grown on GaAs epilayers provide a direct measurement of ZnSe deformation potentials.
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