In this paper we extend the continuum model for interdigital dielectrometry sensors and propose a new, direct technique for estimating material electrical properties from measurements. Interdigital sensors consist of alternating pairs of long, thin electrodes on a plane. An ideal model assumes that the periodic structure extends to infinity and the electrodes have no thickness. We extend this ideal analysis to account for the physical thickness of the electrodes. We also present the model in a matrix form which is amenable to linear algebraic analysis techniques. In particular, the 'inverse problem' of estimating material properties is formulated as a generalized Eigenvalue problem, which avoids the convergence problems of previous iterative algorithms.
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