This report studies reflection and transmission of a TE plane wave from a 2D random thin film with statistically anisotropic fluctuation by means of the stochastic functional approach. By starting with a representation of the random wavefield presented in the previous paper IEICE Trans. Electron., Vol. E92-C, 2009, a solution algorithm of the multiple renormalized mass operator is newly presented. The multiple renormalized mass operator, the first-order incoherent scattering cross section and the optical theorem are numerically calculated. The relation between statistical properties and anisotropic fluctuation is discussed.
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