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Galvanomagnetic characteristics of semiconducting circular flat samples

机译:Galvanomagnetic characteristics of semiconducting circular flat samples

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摘要

A study of circular flat samples in connection with the van der Pauw and Wasscher methods and the magnetoresistance skewness effect for galvanomagnetic measurements is reported. The results concern the position of the four-contact system and the orientation of the magnetic field with respect to the principal resistivity directions on the sample plane. As is shown, the necessary information is provided by the sample behaviour. Furthermore, in the case of isotropic material, a simple formula has been found, from which the zero-field resistivity can be determined by a single measurement.

著录项

  • 来源
    《semiconductor science and technology》 |1992年第11期|1350-1354|共页
  • 作者

    D S Kyriakos; O E Valassiades;

  • 作者单位

    Dept. of Phys., Aristotle Univ. of Thessaloniki, Macedonia, Greece;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

  • 入库时间 2024-01-25 19:44:46
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