Synchrotron X-ray diffraction study of ZnTe at high pressure

摘要

ZnTe has been studied at high pressure to 76 GPa and at room temperature in a diamond-anvil cell using angle-dispersive X-ray diffraction 4 technique with synchrotron radiation and an imaging plate detector. The equation-of-state parameters of the two high-pressure phases of ZnTe were for the first time derived to be B-0 = 91.3(7.0) GPa and B'(0) = 0.8(1.0) for the cinnabar-type phase and B0 = 134(5) GPa and B'(0) = 2.4(1) for the Cmcm-type phase, respectively. (C) 2007 Elsevier Ltd. All rights reserved.