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首页> 外文期刊>IEICE Transactions on fundamentals of electronics, communications & computer sciences >The Integrated Scheduling and Allocation of High-Level Test Synthesis
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The Integrated Scheduling and Allocation of High-Level Test Synthesis

机译:The Integrated Scheduling and Allocation of High-Level Test Synthesis

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摘要

This paper presents a high-level test synthe- sis algorithm foroperation scheduling and data path allocation. Data path allocationis achieved by a controllability and observ- ability balanceallocation technique which is based on testability analysis atregister-transfer level. Scheduling, on other hand, is carried out byrescheduling transformations which change the de- fault scheduling toimprove testability. Contrary to other works in which the schedulingand allocation tasks are performed inde- pendently, our approachintegrates scheduling and allocation by performing themsimultaneously so that the effects of scheduling and allocation ontestability are exploited more effectively. Ad- ditionally, sincesequential loops are widely recognized to make a design hard-to-test,a complete (functional and topological) loop analysis is performed atregister-transfer level in order to avoid loop creation during theintegrated test synthesis process. With a variety of synthesisbenchmarks, experimental results show clearly the advantages of theproposed algorithm.

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