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机译:Pressure dependence of thickness and refractive index of thin PMMA-films investigated by surface plasmon and optical waveguide spectroscopy
Max Planck Institut fur Polymerforschung, Ackermannweg 10, D-55128 Mainz;
Institut fur Chemie, Universitat Osnabruck, Barbarastr. 7, D-49069 Osnabruck;