THRESHOLD SWITCHING AND THERMAL FILAMENTS IN AMORPHOUS SEMICONDUCTORS

摘要

Threshold switching in a thick specimen of an amorphous semiconductor was studied. With the aid of an infrared viewer, the existence of a thermal filament during switching was confirmed. By spectral analysis, the temperature of this filament was estimated to be between 650 and 800 deg;C. No crystals were observed in the nonoxide glass, either before or after switching had occurred.