Analyzing path delay fault testability of RTL data paths: a non-scan approach

摘要

In this paper we analyze the testability of RTL data paths targeting all detectable path delay faults. The concept of RTL path is introduced. Based on this concept a definition for 2-pattern (path delay fault) testable data path is developed. Some necessary and sufficient conditions to support the propagation of 2-pattern vectors for two or more control paths are pointed out. A graph approach of our analysis is also presented.