Changes in optical reflectivity of hydrogenated amorphous silicon films of up to 90percnt; have been induced by Ar laser processing, and are correlated with hydrogen evolution from the material. Accompanying changes greater than three orders of magnitude in resistivity also provide a mechanism for interrogation of the stored data by an electron beam. Storage densities as high as 109bits/in2for optical recording and 1011bits/in2for recording with electron beams are predicted on the basis of these results.
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