Measurement of the ferroelectric distributions using nonlinear dielectric response and piezoelectric response

摘要

Scanning Nonlinear Dielectric Microscopy (SNDM) is the first successful purely electrical method for observing the nonlinear dielectric distributions. Now its resolution has become to the sub-nanometer order with conductive cantilever for the probe needle. On the other hand, as another method for measuring the ferroelectric domains, the piezoelectric response imaging method is often used. In this paper, we compare the resolution of SNDM with that of piezoelectric response and confirm that SNDM has much higher resolution than that obtained by piezo imaging. Finally, the fundamental study to apply SNDM system to the ferroelectric reading and writing system are performed.