Electrical measurements in highTcBihyphen;Srhyphen;Cahyphen;Cuhyphen;O thin films

摘要

Electrical measurements were performed on polycrystalline thin films of the highTcBihyphen;Srhyphen;Cahyphen;Cuhyphen;O system. The resistance of the superconducting state was confirmed to be smaller than 10minus;8OHgr;thinsp;cm at 100 K. It is confirmed directly that the critical current density at 77 K was in excess of 105A/cm2and the dependence of critical current on temperature was able to be represented approximately by (1minus;T/Tc)2.