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Experimental evidence of both interstitialhyphen; and vacancyhyphen;assisted diffusion of Ge in Si

机译:Experimental evidence of both interstitialhyphen; and vacancyhyphen;assisted diffusion of Ge in Si

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摘要

We present the first experimental identification of the diffusion mechanisms of Ge in Si. Using thermal nitridation reactions to create either excess selfhyphen;interstitials or vacancies, it is established that under equilibrium conditions at 1050thinsp;deg;C Ge diffusion takes place by both substitutionalhyphen;interstitial interchange and vacancy mechanisms, with comparable contributions from each. If previous conjectures that Ge diffusion in Si is similar to Si selfhyphen;diffusion are correct, our findings support the idea that Si selfhyphen;diffusion takes place by both interstitial and vacancy mechanisms.

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  • 来源
    《applied physics letters》 |1989年第9期|843-845|共页
  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
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