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On the contribution of recombination currents in Schottky barrier diodes

机译:On the contribution of recombination currents in Schottky barrier diodes

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摘要

It is demonstrated that for Schottky diodes with barrier heights of the order of 0.7 eV the bulk depletion region recombination is unlikely to be responsible for significant deviations from unity of the diode ideality factor, m; that is in the range 1.02>p prevails, causing the recombination process to become increasingly limited by the hole concentration, which changes insignificantly with increasing forward bias. The recombination current thus reaches a maximum at low bias, and the saturates. Alternative parasitic mechanisms and the implications for technologically important diodes are discussed.

著录项

  • 来源
    《semiconductor science and technology》 |1994年第12期|2295-2297|共页
  • 作者

    N J Woods; S Hall;

  • 作者单位

    Dept. of Electr. Eng.&Electron., Liverpool Univ., UK;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

  • 入库时间 2024-01-25 19:35:15
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