Estimation of electromagnetic noise from digital IC by using small size TEM cell

摘要

This paper describes a method for measuring adjacent electromagnetic fields from digital ICs using small size TEM cells. This method calculates the adjacent electric and magnetic fields from the IC by measuring the outputs from the TEM cell in a four-directional setup of the device under test (DUT). The method is verified by using micro-strip lines as the DUT. The adjacent magnetic field from the digital IC as measured by this method agrees with the adjacent magnetic field as measured by a magnetic probe (shielded loop). This method is effective for evaluating adjacent electromagnetic fields from digital ICs.