机译:Lines of Comments as a Noteworthy Metric for Analyzing Fault-Proneness in Methods
Ehime Univ, Ctr Informat Technol, Matsuyama, Ehime 7908577, Japan;
Okayama Prefectural Univ, Fac Comp Sci & Syst Engn, Soja 7191197, Japan;
product metrics; fault-prone method prediction; comments; regression model;