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首页> 外文期刊>IEICE transactions on electronics >Millimeter-Wave Ellipsometry Using Interface-Planarization Prism
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Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

机译:Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

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摘要

The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements. key words: ellipsometry, millimeter wave, UTC-PD, biological tissue

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