机译:Evaluation of Chemical Composition and Bonding Features of Pt/SiO_x/Pt MIM Diodes and Its Impact on Resistance Switching Behavior
Graduate School of Advanced Sci- ences of Matter, Hiroshima University, Higashihiroshima-shi, 739- 8530 Japan;
Graduate School of Engineering, Na-goya University, Nagoya-shi, 464-8603 Japan;
Resistive Random Access Memory (ReRAM); Si oxide; Pt elec-trodes; chemical bonding features; resistance switching;