Edge and finite size effects in polycrystalline ferroelectrics

摘要

This paper proposes a method to engineer the effects of mesa aspect ratio on polarization switching for single-crystal and polycrystalline PZT nanostructures. The out-of-plane polarization switching of single-crystal and polycrystalline structures as a function of crys-tallographic orientation, epitaxial strain and mesa aspect ratio are explored. The results are summarized in terms of the mesa geometrical parameters, crystallographic orientation and expitaxial strain. The results demonstrate a strong correlation of single-crystal properties to the polarization hysteresis behavior of a central representative grain in a polycrystalline film.