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Comparison of the quantitative results corrected by fundamental parameter method and difference calibration specimens in X-ray fluorescence spectrometry

机译:基本参数法校正的定量结果与X射线荧光光谱法中差异校准样品的比较

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摘要

Three kinds of standard specimens, including low-alloy steels (Japanese iron and steel CRM), glass from NIST and Chinese geological reference materials were analyzed by wavelength dispersive X-ray fluorescence spectrometry as unknown samples. The fundamental parameter method was used to correct the matrix effect and different specimens including pure element specimens and type specimens were employed as calibration samples. The quantitative results were compared in order to study the influence of calibration samples on the accuracy of quantitative results. The study showed that the fundamental parameter method could correct the matrix effects very well and relatively accurate quantitative results could be obtained, corrected by simple specimens, in case of type calibration specimens' absence. (c) 2005 Elsevier Ltd. All rights reserved.
机译:采用波长色散X射线荧光光谱法分析了低合金钢(日本钢铁CRM)、NIST玻璃和中国地质参考材料等3种标准试样作为未知样品。采用基本参数法校正基质效应,并采用纯元素试样和型试样等不同试样作为校准试样。对定量结果进行比较,以研究校准样品对定量结果准确性的影响。研究表明,基本参数法可以很好地校正基质效应,在类型校准试样缺失的情况下,通过简单试样校正即可获得相对准确的定量结果。(c) 2005 爱思唯尔有限公司保留所有权利。

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