机译:基本参数法校正的定量结果与X射线荧光光谱法中差异校准样品的比较
Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 200050, Peoples R China;
Chinese Acad Sci, Grad Sch, Beijing 100039, Peoples R China;
Kyoto Univ, Ctr Ecol Res, Otsu, Shiga 5202113, Japan;
WDXRF; fundamental parameter method; calibration specimens; quantitative result; EMPIRICAL COEFFICIENTS;