Anomalous X-ray diffraction (XRD) is a powerful solution for conducting element specific analysis of atomic-level structures in each crystalline phase and specific crystallographic sites within each phase, i.e.,evaluating the degree of order. It uses the wavelength selective feature of synchrotron X-rays, which is quite valid for Heusler alloys. By using anomalous XRD, we evaluate structures of Heusler alloy thin films including Co-based thin films, polycrystalline thin films, and Mn_2CoAl thin films; the last are predicted as a spin-gapless semiconductor.
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