This paper presents a novel optical sensor that can determine the refractive index of many materials, alloys and fluids. In this method, by using a small silicon wire structure with dimensions of 4 mu m x 0.7 mu m, x 0.3 mu m with two reciprocating walls covered with gold and a vertical window, we will be able to calculate the refractive index of materials at the wavelength of 1.3 mu m. The settling time to determine the refractive index of this optical sensor is only 375 fs, so it will be able to record very fast refractive index changes. This sensor is incredibly sensitive even to smallest changes for real and imaginary parts of the refractive index. This sensor presents a new measurement criterion for sensitivity which amounts to S = 145000 and its numerical simulation has been performed by FDTD algorithm.
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机译：本文提出了一种新型光学传感器，可以测定许多材料、合金和流体的折射率。在这种方法中，通过使用尺寸为 4 μ m x 0.7 μ m、x 0.3 μm 的小型硅线结构，具有两个覆盖着金的往复壁和一个垂直窗口，我们将能够计算出波长为 1.3 μm 的材料的折射率。确定该光学传感器折射率的稳定时间仅为 375 fs，因此它能够记录非常快的折射率变化。该传感器对折射率的实部和虚部的微小变化也非常敏感。该传感器提出了一种新的灵敏度测量标准，其规模为S = 145000，其数值模拟已通过FDTD算法进行。
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