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Review-Design and Characterization of Digital Gates based on CNTFET and CMOS Technology

机译:综述-基于CNTFET和CMOS技术的数字门的设计和表征

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摘要

In this paper we review a procedure to design and characterize logic gates based on CNTFET and CMOS technology. For the first technology we use a CNTFET model, already proposed by us, while for the second one we use the BSIM4 model of the Advanced Design System (ADS) library. In particular we consider NAND and NOT gates at different supply voltages and frequencies, for both technologies. The optimal results, obtained using the simulator ADS, are at 0.5 V and 50 GHz for CNTFET, while for CMOS technology at 3 V and 200 MHz. Moreover we quantitatively show the comparison between the two considered technologies in term of delay and power delay product (PDP).
机译:在本文中,我们回顾了一种基于CNTFET和CMOS技术设计和表征逻辑门的程序。对于第一种技术,我们使用我们已经提出的CNTFET模型,而对于第二种技术,我们使用高级设计系统(ADS)库的BSIM4模型。特别是,对于这两种技术,我们考虑了不同电源电压和频率下的NAND和NOT门。使用仿真器ADS获得的最佳结果为CNTFET的0.5 V和50 GHz,而CMOS技术的最佳结果为3 V和200 MHz。此外,我们定量地展示了两种所考虑的技术在延迟和功率延迟积(PDP)方面的比较。

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