首页> 外文期刊>Journal of the Brazilian Society of Mechanical Sciences and Engineering >Temperature rise and thermal runaway phenomena in Flooded Lead-Acid Batteries based on experimental studies
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Temperature rise and thermal runaway phenomena in Flooded Lead-Acid Batteries based on experimental studies

机译:基于实验研究的富液式铅酸蓄电池温升及热失控现象

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摘要

Nowadays, Flooded Lead-Acid Batteries (FLAB) during fast-charging and discharging processes, besides the challenges associated with reducing capacity, have major thermal challenges such as temperature rise (TR) and thermal runaway (TRA) phenomena. Moreover, the behavior of gas bubbles in the electrolyte has importance on the battery performance. In this study, to control the TR and TRA phenomena in different FLAB cells during different C-rates of charging and discharging processes, the behavior of gas bubbles in the electrolyte using particle image velocimetry method is investigated. The results show that in the C-rate of C/5, C/7, C/10, the temperature of FLAB cells trends to a certain and safe value, therefore, it is not possible to reach TRA conditions if the charging process continues for these FLAB cells. But in the C-rate of 1C, the temperature of FLAB cells rise sharply, so that the TRA might occur by continuing the charging process. This paper is shown that increase in the temperature is directly related to the void fraction of gas bubbles in the electrolyte and its effect on FLAB polarization resistance. Also, it has been proved that increasing the electrode gaps from 2 to 10 mm in FLAB cells, especially in the C-rates of C/5-1C, is effective in reducing void fraction of gas bubbles, FLAB resistance and thus decreasing TR rate.
机译:如今,富液式铅酸电池 (FLAB) 在快速充放电过程中,除了与降低容量相关的挑战外,还存在温升 (TR) 和热失控 (TRA) 现象等重大热挑战。此外,电解液中气泡的行为对电池性能也很重要。本研究采用粒子图像测速法研究了不同放电过程中不同FLAB电池中TR和TRA现象,研究了电解液中气泡的行为。结果表明,在C/5、C/7、C/10的C倍率下,FLAB电池的温度趋向于一定的安全值,因此,如果继续充电,这些FLAB电池的温度不可能达到TRA条件。但在 1C 的 C 倍率下,FLAB 电池的温度急剧升高,因此继续充电过程可能会发生 TRA。结果表明,温度的升高与电解液中气泡的空隙率及其对FLAB极化电阻的影响直接相关。此外,已经证明,将FLAB电池的电极间隙从2 mm增加到10 mm,特别是在C/5-1C的C速率下,可以有效降低气泡的空隙率、FLAB电阻,从而降低TR速率。

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