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An eFPGA Generation Suite with Customizable Architecture and IDE

机译:具有可定制架构和IDE的eFPGA生成套件

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摘要

From edge devices to cloud servers, providingoptimized hardware acceleration for specific applications has becomea key approach to improve the efficiency of computer systems.Traditionally, many systems employ commercial fieldprogrammablegate arrays (FPGAs) to implement dedicatedhardware accelerator as the CPU’s co-processor. However, commercialFPGAs are designed in generic architectures and are providedin the form of discrete chips, which makes it difficult tomeet increasingly diversified market needs, such as balancing reconfigurablehardware resources for a specific application, or tobe integrated into a customer’s system-on-a-chip (SoC) in theform of embedded FPGA (eFPGA). In this paper, we proposean eFPGA generation suite with customizable architecture andintegrated development environment (IDE), which covers the entireeFPGA design generation, testing, and utilization stages.For the eFPGA design generation, our intellectual property (IP)generation flow can explore the optimal logic cell, routing, andarray structures for given target applications. For the testability,we employ a previously proposed shipping test method thatis 100 accurate at detecting all stuck-at faults in the entireFPGA-IP. In addition, we propose a user-friendly and customizableWeb-based IDE framework for the generated eFPGA basedon the NODE-RED development framework. In the case study,we show an eFPGA architecture exploration example for a differentialprivacy encryption application using the proposed suite.Then we show the implementation and evaluation of the eFPGAprototype with a 55nm test element group chip design.
机译:从边缘设备到云服务器,为特定应用提供优化的硬件加速已成为提高计算机系统效率的关键方法。传统上,许多系统采用商用现场可编程门阵列 (FPGA) 来实现专用硬件加速器作为 CPU 的协处理器。然而,商用FPGA采用通用架构设计,并以分立芯片的形式提供,这使得它难以满足日益多样化的市场需求,例如为特定应用平衡可重构的硬件资源,或以嵌入式FPGA(eFPGA)的形式集成到客户的片上系统(SoC)中。在本文中,我们提出了一个具有可定制架构和集成开发环境(IDE)的eFPGA生成套件,涵盖了整个eFPGA设计生成、测试和利用阶段。对于eFPGA设计生成,我们的知识产权(IP)生成流程可以探索给定目标应用的最佳逻辑单元、布线和阵列结构。对于可测试性,我们采用了之前提出的出货测试方法,该方法可以 100% 准确地检测整个 FPGA-IP 中的所有卡住故障。此外,我们还提出了一个用户友好且可定制的基于 Web 的 IDE 框架,用于基于 NODE-RED 开发框架生成的 eFPGA。在案例研究中,我们展示了一个eFPGA架构探索示例,该示例用于使用所提出的套件的差分隐私加密应用。然后,我们展示了采用 55nm 测试元件组芯片设计的 eFPGA 原型的实现和评估。

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