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X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

机译:X-Ray Diffraction Study of Crystal Structure and Thin Films of Chromium(II) Phthalocyaninate

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摘要

Crystal structure of Cr(II) phthalocyaninate (CrPc) was determined by means of single-crystal X-ray diffraction. It was shown that after vacuum sublimation CrPc crystallized as a beta-polymorph, which was isostructural to beta-polymorphs of other metal phthalocyanines. When deposited onto glass substrate by organic molecular beam deposition, CrPc formed thin films with strong preferred orientation, consisting of alpha-polymorph. It was shown that both beta-CrPc powder and alpha-CrPc films were unstable in air and transformed to Cr(OH)Pc. X-Ray diffraction (XRD) studies showed that beta-CrPc polycrystalline powder after storage in air (relative humidity 20 ) began to exhibit the first signs of degradation already in 1 hour, while the first changes in XRD patterns of alpha-CrPc films became noticeable only after a few days. Annealing of alpha-CrPc films at 250 degrees C in air at a relative humidity of 70 leads to their faster conversion to Cr(OH)Pc, and the resulting films have a high degree of crystallinity.

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