机译:Quantification of surface erosion in polymeric insulating material under electrical stress using FTIR, SEM and edge detection
Department of Electrical Engineering, GH Patel College of Engineering and Technology|Gujarat Technological University;
Department of Electrical Engineering, GH Patel College of Engineering and Technology;
silicon rubber insulator; surface degradation; erosion; IP test; Fourier transform infrared; FTIR; scanning electron microscopy; SEM; edge detection;