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Effect of electric current stressing on mechanical performance of solders and solder joints: A review

机译:电流应力对焊料和焊点机械性能的影响研究进展

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摘要

Mechanical performance is one of the most important factors influencing the reliability of solder joints. Heretofore, plenty of works have been conducted on reliability of solder joints under various mechanical loads. However, with the miniaturization of electronic products, the current density flowing through the solder joints is increasing. Electric current stressing can induce microstructure evolution, and mechanical performance of solder joints may be altered consequently, which leads to electric current stressing becoming an important factor affecting the mechanical reliability of solder joints. Therefore, this review focuses on summarizing the influence of electric current stressing on the mechanical performance, which involves tensile, shear, creep, fatigue and thermal cycling, shock, vibration and nano-indentation performances, of solder and solder joints. Moreover, the mechanical performance of solders and solder joints can be tested after and concurrent with electric current stressing. Although the mechanical test of solders and solder joints with electric current stressing is more valuable for assessing the serving reliability of solder joints, the mechanical test of solders and solder joints after electric current stressing can be inspiring and enlightening for clarifying the failure mechanism of solder joints in the former condition. Therefore, they will be elaborated separately and sequentially in this review. Furthermore, the remained key issues and possible research directions on the current topic are also pointed out. GRAPHICS .
机译:机械性能是影响焊点可靠性的最重要因素之一。迄今为止,已经对焊点在各种机械载荷下的可靠性进行了大量研究。然而,随着电子产品的小型化,流经焊点的电流密度越来越大。电流应力会引起微观结构的演变,从而改变焊点的力学性能,导致电流应力成为影响焊点机械可靠性的重要因素。因此,本文重点总结了电流应力对焊料和焊点的拉伸、剪切、蠕变、疲劳和热循环、冲击、振动和纳米压痕性能的影响。此外,焊料和焊点的机械性能可以在电流应力之后和同时进行测试。虽然电流应力焊料和焊点的力学测试对于评估焊点的使用可靠性更有价值,但电流应力后焊料和焊点的力学测试对于阐明焊点在前一种条件下的失效机理具有启发性和启发性。因此,本文将分别按顺序对它们进行阐述。此外,还指出了当前课题的剩余关键问题和可能的研究方向。[图形] .

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