机译:快速电子辐照硅n~+-p结构时注入辐射缺陷的效率
Institute of Nuclear Physics, Uzbek Academy of Sciences, 100214, Tashkent, Uzbekistan;
Tashkent Al-Khwarizmi University of Information Technologies, 100084, Tashkent, Uzbekistan;
silicon; radiation defect; doping; electron; lifetime; structure; n–p junction;