首页> 外文期刊>Optical and Quantum Electronics >Modulating the optical and electrical properties of MoSe2 (Molybdenum diselenide) and WS2 (Tungsten disulfide) monolayer by the adsorption of halogen (F, Cl, Br, I and At) atoms
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Modulating the optical and electrical properties of MoSe2 (Molybdenum diselenide) and WS2 (Tungsten disulfide) monolayer by the adsorption of halogen (F, Cl, Br, I and At) atoms

机译:通过吸附卤素(F、Cl、Br、I和At)原子来调节MoSe2(二硒化钼)和WS2(二硫化钨)单层的光学和电学性能

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摘要

Abstract First principle calculations based on a density functional approach are used to study electrical and optical characteristics of MoSe2 (Molybdenum diselenide) and WS2 (Tungsten disulfide) nanostructures adsorbed with halogens such as F, Cl, Br, I and At. Spectral analysis of pristine MoSe2 and WS2 shows substantial absorption peaks in the visible spectrum (380–490 nm) as well as in the complete ultraviolet region (below 400 nm). For nanostructures of MoSe2—F, MoSe2—Cl, MoSe2—Br, MoSe2—I, WS2—Cl, WS2—Br, WS2—I and WS2 –At, absorption peaks are scattered over the entire visible region. It is observed that absorption spectrum peaks shift to higher energy ranges, contributing to blue-shift phenomenon. Structures formed by adsorption of Astatine (At) atom on MoSe2 and Fluorine (F) atom on WS2 leads to red-shift phenomenon where the absorption peaks shift towards the lower energy spectrum range. It is worth noting that all halogen adsorbed structures have excellent performance throughout the entire visible spectrum, making them extremely useful for optoelectronics applications. Furthermore, all measured dielectric constants have been found to coincide with the measured refractive index values.
机译:摘要 采用密度泛函方法的第一性原理计算方法研究了F、Cl、Br、I、At等卤素吸附MoSe2(二硒化钼)和WS2(二硫化钨)纳米结构的电学和光学特性。原始 MoSe2 和 WS2 的光谱分析显示,在可见光谱 (380–490 nm) 以及整个紫外区域(低于 400 nm)中都存在大量的吸收峰。对于MoSe2—F、MoSe2—Cl、MoSe2—Br、MoSe2—I、WS2—Cl、WS2—Br、WS2—I和WS2—At的纳米结构,吸收峰分散在整个可见光区域。据观察,吸收光谱峰向更高的能量范围偏移,导致蓝移现象。砹(At)原子吸附在MoSe2上,氟(F)原子吸附在WS2上形成的结构导致红移现象,吸收峰向较低的能谱范围移动。值得注意的是,所有卤素吸附结构在整个可见光谱中都具有出色的性能,使其在光电子应用中非常有用。此外,发现所有测量的介电常数都与测量的折射率值一致。

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