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Positive temperature coefficient of resistance of Mg-GeO2 nanowire array film

机译:Mg-GeO2纳米线阵列薄膜的正电阻温度系数

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摘要

Here, glancing angle deposition is employed to synthesize the undoped GeO2 and Mg-doped (0.4 and 0.8 at. ) GeO2 nanowires (NWs) on a Si substrate. The microscopic images show the formation of the NW-like morphology of the grown materials. The gradual decrease in the average ratio of length to diameter depicts the worsening of the formation of NWs with the incorporation of Mg into the GeO2 host lattice. This also affects the crystallinity characteristics of the materials, which have been demonstrated from the selected area electron diffraction (SAED) pattern of the materials. The polycrystallinity nature of undoped GeO2 NWs changes to amorphous due to the introduction of Mg, which has been confirmed from both the obtained SAED and x-ray diffraction patterns of the samples. The presence of Mg was confirmed from the obtained broad bands at 473 and 437 cm(-1) in the Fourier transmission spectrum of the doped samples. The increasing conductance with the temperature of Au/undoped GeO2 devices can be explained by the thermionic emission process, whereas the Mg-GeO2 device shows an overall decrease in conductance with increasing temperature. We have ascribed the origin of this abnormal conductance as the positive temperature coefficient of resistance, which is one of the first reports, due to the generation of random grain boundaries and enormous electron trapping at the Au/Mg-GeO2 NW junction. Furthermore, the undoped GeO2 NW device shows good temperature-dependent conductivity as well as stability compared to the doped one.
机译:本文采用掠角沉积法在硅衬底上合成未掺杂的GeO2和Mg掺杂(0.4%和0.8%)GeO2纳米线(NWs)。显微图像显示了生长材料的NW样形态的形成。长度与直径平均比的逐渐减小表明,随着Mg掺入GeO2主体晶格中,NWs的形成恶化。这也影响了材料的结晶特性,这已经从材料的选定区域电子衍射(SAED)图谱中得到证明。由于Mg的引入,未掺杂的GeO2 NWs的多晶性质变为无定形,这已从样品的SAED和X射线衍射图中得到证实。从掺杂样品的傅里叶透射光谱中473和437 cm(-1)处获得的宽带证实了Mg的存在。Au/未掺杂的GeO2器件的电导率随温度升高可以用热离子发射过程来解释,而Mg-GeO2器件的电导率随着温度的升高而总体降低。我们将这种异常电导的起源归因于电阻的正温度系数,这是最早的报道之一,这是由于在Au/Mg-GeO2 NW结处产生随机晶界和巨大的电子捕获。此外,与掺杂器件相比,未掺杂的GeO2 NW器件显示出良好的温度依赖性电导率和稳定性。

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