机译:Online Junction Temperature Measurement for SiC MOSFET Based on Dynamic Threshold Voltage Extraction
College of Electrical and Information Engineering, Hunan University, Changsha, China;
Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL, USA;
Silicon carbide; MOSFET; Temperature measurement; Threshold voltage; Logic gates; Temperature sensors; Junctions; Junction temperature extraction; reliability; SiC sc xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/Math;