Laser Setup for Testing Silicon Microstrip Detectors

摘要

A setup for conducting channel-by-channel testing and calibration of microstrip silicon detectors using collimated laser pulses is described. A feature of this setup is the use of an infrared laser diode to simulate a signal from the passage of a charged particle through the detector substance. A system of lenses makes it possible to obtain a transverse beam size of up to 5 mu m, which, in combination with the use of a precision stepper motor, allows testing of each detector channel in an automatic mode. The operation of the system on modules of the BM@N silicon track system is demonstrated.