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首页> 外文期刊>Journal of Applied Physics >Surface trap characteristics of polyimide and effect of surface charge accumulation on surface flashover
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Surface trap characteristics of polyimide and effect of surface charge accumulation on surface flashover

机译:Surface trap characteristics of polyimide and effect of surface charge accumulation on surface flashover

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摘要

Charge accumulation on the surface of insulation dielectric used in high voltage DC equipment is one of the important causes of surface flashover. Surface charge accumulation is closely related to surface trap characteristics. In this paper, the surface trap energy level distribution of polyimide (PI) was calculated and analyzed by the corona charging method and surface potential decay method. Besides, electron and hole trap characteristics were studied by changing the polarity and amplitude of the charging voltage. Furthermore, the influence of surface charge polarity and quantity on the flashover voltage was researched. Experimental results indicate that the energy level of traps corresponding to the maximum trapped charge density ranges around 0.94 eV. In addition, the energy level of the hole trap is slightly higher than that of the electron trap. The maximum charge density captured by the electron trap and hole trap is about 1.17 x 10(21) and 1.03 x 10(21) eV(-1) m(-3), respectively. The polarity of the surface charge can influence the conductivity characteristics of PI, the surface heterocharge reduces the volume conductivity by about 80% while the surface homocharge improves the volume conductivity of PI by about 6.4 times. Besides, both negative and positive surface charges can improve surface conductivity. The polarity of surface charge influences the flashover characteristics of PI, the flashover voltage increases by about 37.8% with the increase of homocharge density and decreases by about 23.8% with the increase of heterocharge density, which is related to the change of electric field near the cathode caused by surface charge accumulation. Published under an exclusive license by AIP Publishing.

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