...
机译:The Impact of Long-Term Memory Effects on the Linearizability of GaN HEMT-Based Power Amplifiers
Univ Aveiro;
Ampleon;
HEMTs; Gallium nitride; Transistors; Voltage control; Predistortion; Linearity; Electron traps; Deep-level traps; digital predistortion (DPD); drain lag; gallium nitride (GaN); high electron mobility transistor (HEMT); linearizability; self-heating; EQUIVALENT-CIRCUIT MODEL; CURRENT COLLAPSE; COMPENSATION; TIME; PREDISTORTION; DESIGN; TRAPS; FIELD;